A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Devices and objects produced from fibers are being increasingly used in everyday life. Fibers are generally imaged in a scanning electron microscope (SEM), which provides elemental analysis, ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

SPIPTM TM version 6.7 enables easy and robust particle analysis in SEM and SPM images, thanks to the new and enhanced detection and splitting options. Using the new Circle Detection method, SPIPTM 6.7 ...

An example of a correlative study between XRM and FIB-SEM has been presented in an earlier study. 1 This article will expand the correlation one step beneath the length scale to link FIB-SEM and TEM, ...

Structural equation modeling (SEM) encompasses such diverse statistical techniques as path analysis, confirmatory factor analysis, causal modeling with latent variables, and even analysis of variance ...