Embedded test compression is a standard technique for dramatically reducing the test data volume and test time on the automatic test equipment. Companies typically aim for 60x to 100x compression for ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Scan technology is essential for testing the digital content of large-volume devices. By using scan, you can make the device itself responsible for some of the “test” chores, and you can shorten the ...